Time-Resolved X-ray Diffraction of Cryogenic Samples Using a Laser Based Plasma Source
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Published:04 Dec 2014
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R. Loetzsch, A. Lübcke, F. Zamponi, T. Kämpfer, I. Uschmann, and E. Förster, in Short Wavelength Laboratory Sources: Principles and Practices, ed. D. Bleiner, J. Costello, F. de Dortan, G. O'Sullivan, L. Pina, and A. Michette, The Royal Society of Chemistry, 2014, pp. 398-406.
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To extend ultra-fast time resolved X-ray diffraction measurements to a wider class of phenomena, this chapter presents investigations of solids at cryogenic temperatures. The setup is described, and results of static measurements of the temperature dependency of SrTiO3 lattice constants, as well as results on the transient behaviour of a system consisting of a SrTiO3 single crystal covered by a thin film of the high temperature superconductor YBa2Cu3O7–δ are presented.
