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Short Wavelength Laboratory Sources: Principles and Practices
Edited by
Davide Bleiner;
Davide Bleiner
University of Bern, Switzerland
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John Costello;
John Costello
Dublin City University, Ireland
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Francois de Dortan;
Francois de Dortan
Institute of Nuclear Fusion- DENIM, UPM, Spain
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Ladislav Pina;
Ladislav Pina
Czech Technical University, Czech Republic
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Alan Michette
Alan Michette
Kings College London, UK
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Hardback ISBN:
978-1-84973-456-1
PDF ISBN:
978-1-84973-501-8
No. of Pages:
451
Published online:
04 Dec 2014
Published in print:
15 Dec 2014
Book Chapter
Nanometer Scale Imaging Using a Desk-Top Laser Plasma EUV Source
By
P.W. Wachulak
;
P.W. Wachulak
Institute of Optoelectronics, Military University of Technology
00-908 Warsaw
Poland
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A. Bartnik
;
A. Bartnik
Institute of Optoelectronics, Military University of Technology
00-908 Warsaw
Poland
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H. Fiedorowicz
H. Fiedorowicz
Institute of Optoelectronics, Military University of Technology
00-908 Warsaw
Poland
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Published:04 Dec 2014
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Page range:
414 - 418
Citation
P. Wachulak, A. Bartnik, and H. Fiedorowicz, in Short Wavelength Laboratory Sources: Principles and Practices, ed. D. Bleiner, J. Costello, F. de Dortan, G. O'Sullivan, L. Pina, and A. Michette, The Royal Society of Chemistry, 2014, pp. 414-418.
Download citation file:
The development of bright, compact, short wavelength sources is a significant step forward in the commercialization of high resolution imaging tools in the near future. The work done so far in EUV and SXR imaging is very extensive; here, a few examples using coherent and incoherent EUV/SXR sources are presented as pointers for further research.
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