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The microstructure of SOFC electrodes is known to influence its performance across all regimes of operation. In recent years, the development and proliferation of high‐resolution tomography techniques has revolutionised our understanding of the relationship between SOFC electrode performance and microstructure. Furthermore, by combination with relevant modelling tools, great insight into the microscopic phenomena occurring within SOFC electrode has been gained. Here we review the current state‐of‐the‐art in focused ion beam and X‐ray nano‐CT techniques and their application to characterise SOFCs.

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