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This chapter outlines how the recent advancements in transmission electron microscope instrumentation have provided new opportunities for high resolution characterisation of inorganic nanoparticle systems. Concentrating on the smallest nanoclusters, nanocrystals and nanoparticles with diameters of 1–50nm we outline how the development of aberration correcting lenses,1–4  brighter, more coherent electron sources,5,6  and smarter, more efficient detector systems,7  has improved electron microscopy imaging and analysis at the nanoscale.8–10 

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