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Nanoscience & Nanotechnology Series
Nanocharacterisation
By
Royal Society of Chemistry
Royal Society of Chemistry
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Edited by
Harold Craighead
Harold Craighead
Cornell University, USA
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Hardback ISBN:
978-0-85404-241-8
PDF ISBN:
978-1-84755-792-6
Series:
Nanoscience & Nanotechnology
No. of Pages:
316
Publication date:
31 Aug 2007
About this book
Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including, Transmission Electron Microscopy, Electron Tomography, Tunneling Microscopy, Electron Holography, Electron Energy Loss Spectroscopy This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.
Royal Society of Chemistry, Nanocharacterisation, The Royal Society of Chemistry, 2007.
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Digital access
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Print format
Nanocharacterisation
$251.00
Table of contents
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Characterisation of Nanomaterials Using Transmission Electron Microscopyp1-27ByD. J. SmithD. J. SmithDepartment of Physics, Arizona State UniversityTempeAZ 85287USASearch for other works by this author on:
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Chapter 2: Scanning Transmission Electron Microscopyp28-65ByA.R. Lupini;A.R. LupiniMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:S.N. Rashkeev;S.N. RashkeevMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:M. Varela;M. VarelaMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:A.Y. Borisevich;A.Y. BorisevichMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:M.P. Oxley;M.P. OxleyMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:K. van Benthem;K. van BenthemMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:Y. Peng;Y. PengMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:N. de Jonge;N. de JongeMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:G.M. Veith;G.M. VeithMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:S.T. Pantelides;S.T. PantelidesMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:M.F. Chisholm;M.F. ChisholmMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:S.J. PennycookS.J. PennycookMaterials Science and Technology DivisionOak Ridge National LabOak RidgeTN37831–6031USASearch for other works by this author on:
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Chapter 3: Scanning Tunneling Microscopy of Surfaces and Nanostructuresp66-93ByM. R. CastellM. R. CastellDepartment of Materials, University of OxfordParks RoadOxfordOX1 3PHUKSearch for other works by this author on:
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Chapter 4: Electron Energy-loss Spectroscopy and Energy Dispersive X-Ray Analysisp94-137ByR. BrydsonR. BrydsonLeeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SPEME, University of LeedsLeedsLS2 9JTUKSearch for other works by this author on:
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Chapter 5: Electron Holography of Nanostructured Materialsp138-183ByR.E. Dunin–Borkowski;R.E. Dunin–BorkowskiDepartment of Materials Science and Metallurgy, University of CambridgePembroke StreetCambridgeCB2 3QZUKCenter for Electron Nanoscopy, Technical University of DenmarkDK-2800 Kongens LyngbyDenmarkSearch for other works by this author on:T. Kasama;T. KasamaFrontier Research SystemThe Institute of Physical and Chemical ResearchHatoyamaSaitama350–0395JapanDepartment of Materials Science and Metallurgy, University of CambridgePembroke StreetCambridgeCB2 3QZUKSearch for other works by this author on:R.J. HarrisonR.J. HarrisonDepartment of Earth Sciences, University of CambridgeDowning StreetCambridgeCB2 3EQUKSearch for other works by this author on:
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Chapter 6: Electron Tomographyp184-267ByM. Weyland;M. WeylandDepartment of Materials Science and Metallurgy, University of CambridgePembroke StCambridgeCB2 3QZUKSearch for other works by this author on:P. A. MidgleyP. A. MidgleyMonash Centre for Electron Microscopy, Monash UniversityClaytonVIC 3800AustraliaSearch for other works by this author on:
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Chapter 7: In-situ Environmental Transmission Electron Microscopyp268-290ByP.L. GaiP.L. GaiDepartment of Chemistry and Department of Physics, The York–JEOL Nanocentre, University of YorkHeslingtonYorkYO10 5DDUKCentral Research and Development LaboratoriesDuPont, Experimental StationWilmington DE19880-0356USAUniversity of DelawareDepartment of Materials Science and EngineeringNewarkDE19716USASearch for other works by this author on:
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