Nanocharacterisation
Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.
Nanocharacterisation, The Royal Society of Chemistry, 2015.
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Table of contents
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Characterization of Nanomaterials Using Transmission Electron Microscopyp1-29ByDavid J. SmithDavid J. SmithSearch for other works by this author on:
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Chapter 2: Scanning Transmission Electron Microscopy1p30-79ByA. R. Lupini;A. R. LupiniMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:S. N. Rashkeev;S. N. RashkeevQatar Energy and Environment Research InstituteP.O. Box 5825DohaQatarSearch for other works by this author on:M. Varela;M. VarelaMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:A. Y. Borisevich;A. Y. BorisevichMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:M. P. Oxley;M. P. OxleyDepartment of Physics and Astronomy, Vanderbilt UniversityNashville, TN37235USASearch for other works by this author on:K. van Benthem;K. van BenthemUniversity of California, Davis, Dept. for Chemical Engineering and Materials Science1 Shields AveDavis, CA95616USASearch for other works by this author on:Y. Peng;Y. PengMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:N. de Jonge;N. de JongeLeibniz Institute for New Materials (INM)66123SaarbrückenGermanySearch for other works by this author on:G. M. Veith;G. M. VeithMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:T. J. Pennycook;T. J. PennycookDepartment of Materials, University of OxfordParks RoadOxfordOX1 3PHUKSuperSTEM Laboratory, STFC DaresburyKeckwick LaneWarringtonWA4 4ADUKSearch for other works by this author on:W. Zhou;W. ZhouMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:R. Ishikawa;R. IshikawaInstitute of Engineering Innovation, University of TokyoBunkyo, Tokyo113-8656JapanSearch for other works by this author on:M. F. Chisholm;M. F. ChisholmMaterials Science and Technology Division, Oak Ridge National LabOak Ridge, TN37831-6031USASearch for other works by this author on:S. T. Pantelides;S. T. PantelidesDepartment of Physics and Astronomy, Vanderbilt UniversityNashville, TN37235USASearch for other works by this author on:S. J. PennycookS. J. PennycookDepartment of Materials Science and Engineering, University of TennesseeKnoxville, TN37996USA[email protected]Search for other works by this author on:
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Chapter 3: Scanning Tunnelling Microscopy of Surfaces and Nanostructuresp80-107ByMartin R. CastellMartin R. CastellSearch for other works by this author on:
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Chapter 4: Electron Energy-loss Spectroscopy and Energy-dispersive X-ray Analysisp108-157ByM. B. Ward;M. B. WardLeeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SCAPE, University of LeedsLeedsLS2 9JTUK[email protected]Search for other works by this author on:N. Hondow;N. HondowLeeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SCAPE, University of LeedsLeedsLS2 9JTUK[email protected]Search for other works by this author on:A. P. Brown;A. P. BrownLeeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SCAPE, University of LeedsLeedsLS2 9JTUK[email protected]Search for other works by this author on:R. BrydsonR. BrydsonLeeds Electron Microscopy and Spectroscopy Centre, Institute for Materials Research, SCAPE, University of LeedsLeedsLS2 9JTUK[email protected]Search for other works by this author on:
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Chapter 5: Electron Holography of Nanostructured Materialsp158-210ByRafal E Dunin-Borkowski;Rafal E Dunin-BorkowskiErnst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum JülichD-52425JülichGermanySearch for other works by this author on:Takeshi Kasama;Takeshi KasamaCenter for Electron Nanoscopy, Technical University of DenmarkDK-2800Kongens LyngbyDenmarkSearch for other works by this author on:Richard J HarrisonRichard J HarrisonDepartment of Earth Sciences, University of CambridgeDowning StreetCambridgeCB2 3EQUK[email protected]Search for other works by this author on:
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Chapter 6: Electron Tomographyp211-299ByMatthew Weyland;Matthew WeylandMonash Centre for Electron Microscopy & Department of Materials Science and Engineering10 Innovation WalkMonash UniversityVIC 3800AustraliaSearch for other works by this author on:Paul A. MidgleyPaul A. MidgleyDepartment of Materials Science and Metallurgy, University of Cambridge27 Charles Babbage RoadCambridgeCB3 0FSUK[email protected]Search for other works by this author on:
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Chapter 7: Scanning Electron and Ion Microscopy of Nanostructuresp300-350ByNatasha Erdman;Natasha ErdmanJEOL USA Inc.Peabody, MAUSASearch for other works by this author on:David C. BellDavid C. BellSchool of Engineering and Applied Science and the Center for Nanoscale Systems, Harvard UniversityCambridge, MAUSA[email protected]Search for other works by this author on:
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