Skip to Main Content
Skip Nav Destination

The scanning transmission electron microscope (STEM) is one of the most useful tools in many areas of atomic-scale materials science and nanocharacterization. A STEM has the ability to generate local maps of the chemical composition and electronic structure at atomic resolution, even in complex or unknown samples. Here we describe the important components of a state-of-the-art aberration-corrected STEM and review the application of STEM imaging to a variety of published nanocharacterisation examples in catalysis and solid state materials problems.

You do not currently have access to this chapter, but see below options to check access via your institution or sign in to purchase.
Don't already have an account? Register
Close Modal

or Create an Account

Close Modal
Close Modal