Chapter 2: Scanning Transmission Electron Microscopy1
-
Published:10 Aug 2015
-
A. R. Lupini, S. N. Rashkeev, M. Varela, A. Y. Borisevich, M. P. Oxley, K. van Benthem, ... S. J. Pennycook, in Nanocharacterisation, ed. A. I. Kirkland and S. J. Haigh, The Royal Society of Chemistry, 2nd edn, 2015, ch. 2, pp. 30-79.
Download citation file:
The scanning transmission electron microscope (STEM) is one of the most useful tools in many areas of atomic-scale materials science and nanocharacterization. A STEM has the ability to generate local maps of the chemical composition and electronic structure at atomic resolution, even in complex or unknown samples. Here we describe the important components of a state-of-the-art aberration-corrected STEM and review the application of STEM imaging to a variety of published nanocharacterisation examples in catalysis and solid state materials problems.